Facilities
Instrument facilities



Microscopic techniques
1. Aomic Force Microscope (AFM):
Bruker’s Multimode 8E instrument where Silicon tip on Nitride cantilevers (SCANASYST-AIR) with a spring constant of 0.4 N/m and frequency of 70 kHz with image processing software NanoScope Analysis 1.40.
DM2700 P

Polarized Optical Microscope: Leica

Confocal Microscope (NCU) : Leica TCS SP8 laser scanning confocal microscope




Scattering techniques
Dynamic Light Scattering Malvern:

Spectroelectrochemistry
Pine research: Spectroelectrochemistry bundle
Potentiostat, Honeycomb Cell, and UV/Vis Spectrometer, fully integrated in one software
Link
Ocean optics integrated setup for spectroelectrochemistry, extended with absorption and emission techniques.

Spectroscopic techniques
1. Absorption

Agilent carry UV-Vis Multicell Peltier

JASCO-V750 Spectrophotometer
JASCO J-1500 CD Spectrometer

JASCO J-815 CD Spectrometer

JASCO J-1500 CD Spectrometer

JASCO J-815 CD Spectrometer

2. Emission

JASCO Spectrofluorometer FP-8500
Horiba delta diode lifetime instrument


JASCO J-1500 CD Spectrometer

JASCO J-1500 CD Spectrometer

JASCO J-1500 CD Spectrometer