Facilities
Instrument facilities
Microscopic techniques
1. Aomic Force Microscope (AFM):
Bruker’s Multimode 8E instrument where Silicon tip on Nitride cantilevers (SCANASYST-AIR) with a spring constant of 0.4 N/m and frequency of 70 kHz with image processing software NanoScope Analysis 1.40.
DM2700 P
Atomic Force Microscope (AFM).
Polarized Optical Microscope (POM): Leica
Scattering techniques
Dynamic Light Scattering (DLS): Malvern
Spectroelectrochemistry
Pine research: Spectroelectrochemistry bundle
Potentiostat, Honeycomb Cell, and UV/Vis Spectrometer, fully integrated in one software
Link
Ocean optics integrated setup for spectroelectrochemistry, extended with absorption and emission techniques.
Spectroscopic techniques
1. Absorption
Agilent Carry UV-Vis Multicell Peltier
JASCO-V750 Spectrophotometer
JASCO J-1500 CD Spectrometer
JASCO J-815 CD Spectrometer
JASCO J-1500 CD Spectrometer
JASCO J-815 CD Spectrometer
2. Emission
JASCO CPL-300 Circularly Polarized Luminescence Spectrophotometer
Horiba Delta Diode Lifetime Instrument
Photoluminescence Spectrofluorometer Edinburgh FLS 1000
JASCO J-1500 CD Spectrometer
JASCO J-1500 CD Spectrometer